Improve Process Safety with Near-Miss Analysis


Valuable information about unsafe conditions resides in the large alarm databases of distributed control systems and emergency shutdown systems. This overlooked and underutilized information can be analyzed to identify process near-misses and determine the probability of serious accidents.

This article introduces the concept of dynamic risk analysis (DRA) based on alarm databases. It provides a general overview of what this is, how it can be used in chemical processing to improve safety, and challenges that must be addressed over the next 5–10 years. It also highlights current research in this area and offers perspective on methodologies most likely to succeed.


Author Bios: 

Ankur Pariyani

Ankur Pariyani, PhD is Co-Founder and Chief Innovation Officer of Near-Miss Management LLC (, where he focuses on product development and innovation (Phone: 267-603-2378; Email: He has authored several papers in leading journals in the area of risk analysis. He holds a Ph.D. from the University of Pennsylvania and a B.Tech from the Indian Institute of Technology in Guwahati, both in chemical engineering.

He has a passion to innovate novel yet...Read more

Dr. Warren Seider

Warren D. Seider is Professor of Chemical and Biomolecular Engineering at the University of Pennsylvania. He received a B.S. degree from the Polytechnic Institute of Brooklyn, and M.S. and Ph.D. degrees from the University of Michigan. For many years,he has contributed to the fields of process analysis, simulation, design, and control. In process design, he coauthored FLOWTRAN Simulation - An Introduction (with J.D. Seader and A.C. Pauls) and Product and Process Design Principles: Synthesis,...Read more

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