Process Monitoring and Fault Detection
AIChE Annual Meeting
2009
2009 Annual Meeting
Computing and Systems Technology Division
Oral
Jackson B
Gaylord Opryland Hotel
Tuesday, November 10, 2009 - 12:30pm to 3:00pm
The emphasis of this session is on the theory and applications of process monitoring and fault diagnosis in both batch and continuous processes. Contributions are sought in, but not limited to, the following areas: development of novel techniques or advances in existing techniques for fault detection, identification, and diagnosis in continuous and hybrid process systems; design of process monitoring systems for flexible manufacturing plants with multiple product recipes and various operating conditions; incorporation of process knowledge into fault detection, identification, and diagnosis; model maintenance (e.g., adaptive model, model update, etc.) and data pre-processing issues (e.g., out-lier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications. Industrial contributions and real-time case studies are encouraged.
Presentations
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Pricing
Individuals
AIChE Pro Members | $150.00 |
AIChE Graduate Student Members | Free |
AIChE Undergraduate Student Members | Free |
AIChE Explorer Members | $225.00 |
Non-Members | $225.00 |