Process Monitoring, Fault Detection, and Diagnosis I
AIChE Annual Meeting
2012
2012 AIChE Annual Meeting
Computing and Systems Technology Division
Oral
Convention Center
Wednesday, October 31, 2012 - 8:30am to 11:00am
Co-chair(s)
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis. Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions. Incorporation of process knowledge into fault detection, identification, and diagnosis. Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications, data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
Presentations
Topics
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Pricing
Individuals
AIChE Pro Members | $150.00 |
AIChE Graduate Student Members | Free |
AIChE Undergraduate Student Members | Free |
AIChE Explorer Members | $225.00 |
Non-Members | $225.00 |