Characterization of Engineered Particles and Nano-Structured Particles
AIChE Annual Meeting
2008 Annual Meeting
Particle Technology Forum
Washington B Room
Loews Philadelphia Hotel
Monday, November 17, 2008 - 3:15pm to 5:45pm
The physical and chemical characterization of engineered particles ranging from the nanometer to the micrometer scale plays an important role in formulation, processing and quality assurance. This session will focus on recent developments in characterization techniques and methodologies. Emphasis will be placed on nanostructured engineered particle systems with several examples of the link between novel characterization techniques and novel engineered structures and properties
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