Fault Detection and Diagnosis II
AIChE Annual Meeting
Cincinnati Convention Center
Wednesday, November 2, 2005 - 3:15pm to 5:45pm
Contributions are sought in the field of process analytical technology (PAT). Both the development of new analytical technologies and their application to process modeling, monitoring, optimization, and control are of interest. All application areas are of interest including pharmaceuticals, semiconductors, nanotechnology, fuel cells, and biotechnology. All analytical technologies are of interest including near-infrared, ATR-FTIR, Raman, in-situ XRD, in-situ particle imaging, and laser-based techniques.
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