Fault Detection and Diagnosis I
AIChE Annual Meeting
Cincinnati Convention Center
Wednesday, November 2, 2005 - 8:00am to 10:30am
The emphasis of this session is on theoretical and application studies related to fault detection and diagnosis for batch and continuous processes. Higher priority will be given to industrial contributions and real-time studies. Contributions are sought in, but not limited to, the following areas: • Novel techniques or advances in existing techniques in fault detection, identification, and diagnosis.
• Process monitoring system for flexible manufacturing plants with multiple product recipes and various operating conditions.
• Incorporation of process knowledge into fault detection, identification, and diagnosis.
• Model maintenance issues (such as adaptive model, model update, etc.) for on-line applications
• Data pre-processing issues (such as outlier detection, sensor validation, filtering, missing value estimation, etc.) for on-line applications.
Paper abstracts are public but to access Extended Abstracts, you must first purchase the conference proceedings.
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