Ravi P. Jaiswal Citation name: Jaiswal, R. P. Affiliation: Purdue University State: IN Country: USA Authored:(80h) Van Der Waals Forces Between Micron-/nano-Scale Contaminants And Non-Homogenous/patterned Substrates- Implications In Photomask CleaningRavi P. Jaiswal2007 Annual Meeting (253a) Effects of Varying Surface Film Thickness on Particle AdhesionKatie M. SmithStephen BeaudoinRavi P. Jaiswal2010 Annual Meeting Associated proceedings: 2007 Annual Meeting 2010 Annual Meeting