Ravi P. Jaiswal | AIChE
Skip to main content
calendar_icon community_icon students_icon publications_icon arrow-down arrow-up
AIChE Sites
  • AIChE
  • Academy
  • Chenected
  • Engage
  • Giving
  • Publications
  • CCPS
  • CEI
  • CHS
  • DIPPR
  • IfS
  • RAPID
  • RE Society
  • SBE
AIChE

Search form

  • Courses
    • Face-to-Face
    • eLearning
    • Train-a-Team
    • My eLearning Courses
    • Calendar
  • Webinars
    • Live
    • Archived
    • Sponsored
    • Webinar Bundles
    • Calendar
  • Videos
    • Conference Presentations
    • Conference Presentation Bundles
    • Academy Videos
  • Curricula
  • About
  • FAQs
  • Contact
  • Login

Ravi P. Jaiswal

  • Citation name:
    Jaiswal, R. P.
  • Affiliation:
    Purdue University
  • State:
    IN
  • Country:
    USA
Authored:
(80h) Van Der Waals Forces Between Micron-/nano-Scale Contaminants And Non-Homogenous/patterned Substrates- Implications In Photomask Cleaning
Ravi P. Jaiswal
2007 Annual Meeting
(253a) Effects of Varying Surface Film Thickness on Particle Adhesion
Katie M. Smith
Stephen Beaudoin
Ravi P. Jaiswal
2010 Annual Meeting

Access to contact information is restricted to users who have purchased the conference's Online Proceedings, or received access to the proceedings as part of the conference Registration.

Please click the links below if you'd like to purchase Online Proceedings for any of the related conferences:

2007 Annual Meeting
2010 Annual Meeting

Translate this page

English Chinese (Simplified) French German Portuguese Spanish
  • LinkedIn
  • Twitter
  • Facebook
  • YouTube
  • Flickr
  • Slide Share
  • About
  • Join AIChE
  • Global
  • Contact
  • Advertise
  • Ethical Guidelines
  • Press
  • Privacy & Security
  • Code of Ethics
  • Sitemap
Copyright © American Institute of Chemical Engineers. All rights reserved.