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5th Engineering Cosmetics and Consumer Products Conference April 22-24, 2024 Le Méridien Philadelphia, Philadelphia, Pennsylvania, USA
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Archived Webinar Want to be an Entrepreneur? Personal Stories From Three Successful Entrepreneurs Who Have Traveled This Path.
Elke Van De Casteele Citation name Van De Casteele, E. Affiliation SkyScan NV Country Belgium Authored(668a) X-Ray Microtomography and Image Analysis as Complementary Methods for Morphological Characterization and Coating Thickness Measurement of Coated ParticlesGiacomo PerfettiElke Van De CasteeleBernd RiegerWillem J. WildeboerGabrie M.H. Meesters2010 Annual Meeting Associated proceedings 2010 Annual Meeting
