Using Near Miss and Minor Incident Data for Process Improvement

Rajan, N. S., Bayer Business & Technilogy Services, LLC
Edwards, V., V H Edwards Technical Analysis

Many facilities log near miss and minor incident data, but how many use this valuable information to guide their process safety improvement program? Major process safety events are relatively rare and not usually a reliable way of determining where safety improvements are needed most. This session will look at best practices for organizing near miss and minor incident data, and then using that data to identify gaps in a site's existing process safety program.



Paper abstracts are public but to access Extended Abstracts, you must first purchase the conference proceedings.


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AIChE Members $150.00
Employees of CCPS Member Companies $150.00
AIChE Graduate Student Members Free
AIChE Undergraduate Student Members Free
Non-Members $225.00