(766f) Surface Characterization of IrOx/SrIrO3 Water-Splitting Catalysts
AIChE Annual Meeting
Friday, November 15, 2019 - 2:00pm to 2:18pm
In this work, we use advanced materials and surface characterization to measure changes in material surface of these previously reported SrIrO3 thin films during catalytic operation, probing properties including crystallographic structure, chemical state, and atomic composition. We utilize techniques such as time of flight-secondary ion mass spectrometry (TOF-SIMS), helium ion microscope-secondary ion mass spectrometry (HIM-SIMS), grazing incidence X-ray diffraction (GI-XRD), and grazing incidence X-ray absorption spectroscopy (GI-XAS) on pre-test and post-test catalyst films to quantify changes that occur during catalytic operation. Ultimately we aim to learn more about the nature of the electrochemically active site and translate this structural information to be able to design better OER catalysts.
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