(375g) Bimetallic Atomic Layer Deposition for Extended Surface Electrocatalysts | AIChE

(375g) Bimetallic Atomic Layer Deposition for Extended Surface Electrocatalysts


McNeary, W. IV - Presenter, University of Colorado Boulder
Linico, A., University of Colorado at Boulder
Ngo, C., Colorado School of Mines
Zaccarine, S., Colorado School of Mines
Lai, A., University of Colorado Boulder
Zack, J., National Renewable Energy Laboratory
Hurst, K., National Renewable Energy Laboratory
Alia, S., National Renewable Energy Laboratory
Mauger, S. A., National Renewable Energy Laboratory
Neyerlin, K. C., National Renewable Energy Laboratory
Buechler, K. J., ALD NanoSolutions, Inc.
Medlin, J., University of Colorado
Pylypenko, S., Colorado School of Mines
Pivovar, B. S., National Renewable Energy Laboratory
Weimer, A., University Of Colorado
Extended surface electrocatalysts based on nanowire templates have emerged as promising candidates for advanced catalysts for the oxygen reduction reaction (ORR) in fuel cell applications. When synthesized by spontaneous galvanic displacement (SGD), these extended surface electrocatalysts have demonstrated exceptional performance (specific activity > 6000 μA/cm2) and superior durability to benchmark carbon-supported Pt catalysts. However, challenges in scale-up and reproducibility of this fabrication process have prompted an investigation into atomic layer deposition (ALD) as a facile, scalable synthesis alternative for the production of extended thin film electrocatalyst structures. The use of a bimetallic ALD process may also allow for tunable control of multiple deposited metals, as opposed to monometallic deposition with SGD. An ALD analog of the SGD synthesis process was developed by combining oxidative Pt and Ni ALD chemistries into various “supercycle” configurations and depositing these metals onto a cobalt nanowire substrate in a viscous flow reactor. In situ mass spectrometry was used to study the deposition reactions, while elemental analysis, transmission electron microscopy, elemental mapping and X-ray diffraction were used to characterize Pt growth and effects of post-treatment procedures, such as H2 annealing.