(686h) Combined Quartz Crystal Microbalance with Dissipation and Generalized Ellipsometry to Characterize the Deposition of Titanium Dioxide Nanoparticles on Model Rough Surfaces
AIChE Annual Meeting
2016
2016 AIChE Annual Meeting
Environmental Aspects, Applications, and Implications of Nanomaterials and Nanotechnology
Environmental Applications of Nanotechnology and Nanomaterials II
Thursday, November 17, 2016 - 2:36pm to 2:54pm
A new mechanical model that considers both viscoelastic and surface roughness effects [3] is described to analyze QCM-D measurements. Obtained parameters include adsorbate areal mass density, adsorbate viscoelastic properties, the vertical roughness length, and the permeability length. Silicon slanted columnar thin films (SCTFs) were deposited onto QCM-D sensors by electron-beam glancing angle deposition and conformably coated with an alumina film via atomic layer deposition to act as model rough surfaces. The adsorption of polyacrylate-stabilized TiO2NPs onto flat surfaces and the SCTFs was measured by QCM-D and generalized ellipsometry (GE), an optical reference technique.
We report that the surface-roughness-modified mechanical model excludes water that is retained by the SCTF surface roughness and instead considers the surface mass density of TiO2NPs and water coupled to the TiO2NPs [4]. GE is also sensitive to the attachment of the TiO2NPs. When the results of both techniques are combined, new information, the hydration of the polyacrylate-stabilized TiO2NPs, can be evaluated.
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[2] M.V. Voinova et al. Phys. Scr., 59, 391 (1999).
[3] L. Daikhin et al. Anal. Chem., 74, 554 (2002).
[4] N. Kananizadeh et al. J. Hazard. Mater., In press. dx.doi.org/10.1016/j.jhazmat.2016.03.048