(7c) Advancing Transmission Electron Microscopy at the NCEM: Prospects for the Detection of Single Light Atoms in Soft and Hard Materials with a TEAM Microscope
AIChE Annual Meeting
2009
2009 Annual Meeting
Materials Engineering and Sciences Division
Accessing Facilities at National Centers, Laboratories, and Synchrotron Radiation Sources
Monday, November 9, 2009 - 9:10am to 9:30am
The National Center for Electron Microscopy (NCEM) is one of the world's foremost centers for electron microscopy and microcharacterization. As a national user facility, NCEM is open to scientists from universities, government and industrial laboratories after critical review of a scientific proposal. NCEM scientists conduct research by applying new techniques to critical materials problems. Here we present the recent developments of two electron optical methods: High-resolution aberration-corrected imaging and phase contrast microscopy using an electrostatic phase plate. These developments aim at maximizing the impact of electron microscopy on the atomic-scale characterization of soft and hard materials.
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