(488e) Atomic-Scale Analysis Of Strained Ultra-Thin Fcc Metallic Films: Defect Dynamics And Strain Relaxation Mechanisms | AIChE

(488e) Atomic-Scale Analysis Of Strained Ultra-Thin Fcc Metallic Films: Defect Dynamics And Strain Relaxation Mechanisms

Authors 

Kolluri, K. - Presenter, University of Massachusetts
Gungor, M. R. - Presenter, University of Massachusetts Amherst
Maroudas, D. - Presenter, University of Massachusetts