(60dc) Monitoring Methods for Fault Detection and Diagnosis: Algorithms and Applications

Many industrial processes collect an abundance of data from different sensors. These sensors often measure a wide variety of physical properties in order to ensure that these parameters are adhering to expected values. This is essential to ensure plant and operator safety, increase economic benefits, and maintain product quality.

A number of algorithms have been developed in order to improve existing fault detection and diagnosis performance. These algorithms integrate a number of different data-driven driven tools and methods. Multiscale wavelet-based representation of data can be used in order to handle data that is autocorrelated, non-Gaussian, and noisy. Hypothesis testing methods such as the Generalized Likelihood Ratio (GLR) technique can be used in order to provide the best possible detection for a fixed false alarm rate. Moreover, certain model-based methods have been developed in order to monitor process drifts and degradations in the process model, even when a process is operating under control.

This work will discuss the different tools utilized in development of the algorithms, their features, and practical applications, including the benchmark Tennessee Eastman Process (TEP).