Multiple factors can affect the performance of advanced controls. These may be due to changes associated with the instrumentation, regulatory controls, or the process itself. If not detected and diagnosed, the effect can be a partial loss of benefits, or in the worst case, the complete loss of benefits due to the controls being switched off. It is therefore important to monitor not just control-specific metrics, but also process measurements and process metrics (KPIs) that may not directly be used by the advanced control system. This presentation will describe a “big data small footprint” approach to statistically analyzing large amounts of historian data to determine when significant changes occur, and identifying candidate variables to facilitate cause and effect determination. Plots and reports are automatically generated for control engineers, process engineers, and instrumentation technicians. A benefit of the approach is bringing these groups together to solve problems and ensure process objectives are met. Examples are presented to highlight the approaches and statistical techniques used.
To receive your PDH certificate contact certificates@aiche.org or 1-800-242-4363.
Watch the following preview of this presentation.
Would you like to access this content?
No problem. You just have to complete the following steps.
You have completed 0 of 2 steps.
-
Log in
You must be logged in to view this content. Log in now.
-
Purchase Technical Presentation
You must purchase this technical presentation using one of the options below.
If you already purchased this content recently, please click here to refresh the system's record of ownerships.
Pricing
| Credits | 0.5 Use credits |
| List Price | $25.00 Buy now |
| AIChE Members | $15.00 Buy now |
| AIChE Fuels and Petrochemicals Division Members | Free Free access |
| AIChE Undergraduate Student Members | Free Free access |
| AIChE Graduate Student Members | Free Free access |
